Advanced Materials Characterization Chapter 11 Low Energy Ion Scattering

Advanced Materials Characterization Chapter 11 - by Igor Bello

ISS represents the group of analytical techniques whose principle is based on the measurement of kinetic energy and intensity of backscattered primary beam ions from atoms of solid surfaces. The backscattered ions of the ion beam probe exchange energy and momenta with surface atoms, and thus, they carry information on the masses of surface atoms.